特點
使用速度為 1M 采樣/秒的 18 位數(shù)字化儀對復雜波形進行采樣；存儲高達 2750 萬個讀數(shù)
以 0.1 μΩ 和 1 pA 靈敏度測試用于低功率電路中的組件
使用高達 14 ppm 的 1 年期精度直流電壓，通過高測試不確定度比率實現(xiàn)測試質(zhì)量
內(nèi)置測試腳本處理器 (TSP®) 可在無需控制器交互的情況下執(zhí)行測試序列，從而減少測試時間和通信開銷，同時利用控制器執(zhí)行其他任務(wù)
將源和測量與 2606B 高密度 4 通道源測量單元 (SMU) 和 DMM7512 相結(jié)合，可實現(xiàn) 4 通道采樣和 2 通道測量功能，而占用的機架空間僅為 2U
無需在 DMM7512 或 2606B 之間提供額外空間以用于熱管理
在 TSP-Link 測試系統(tǒng)中最多可控制 32 臺儀器
以低于 500 ns 的延遲同步測量值
消除儀器和 PC 之間耗時的通信
DMM7512 TSP 代碼與 DMM7510 TSP 代碼兼容
The characteristics of
Complex waveforms were sampled using an 18-bit digitizer with a sampling speed of 1M/s. Stores up to 27.5 million readings
In 0.1 mu Ω and 1 pA sensitivity test for low power components in the circuit
The highest test quality is achieved with a high test uncertainty ratio using up to 14 PPM of one-year precision dc voltage
Built-in test script processor (TSP ®) can be performed in the case of without the controller test sequence, thus reducing the test time and communication overhead, at the same time using the controller to perform other tasks
By combining the source and measurement with the 2606B high-density 4-channel source measurement unit (SMU) and DMM7512, the 4-channel sampling and 2-channel measurement functions can be realized, and the rack space occupied is only 2U
There is no need to provide additional space between DMM7512 or 2606B for thermal management
Up to 32 instruments can be controlled in the TSP-Link test system
The measurements were synchronized with a delay of less than 500 ns
Eliminates time-consuming communication between the instrument and the PC
DMM7512 TSP code is compatible with DMM7510 TSP code
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