詳細(xì)介紹
特性和優(yōu)點
P6248
1.7 GHz(典型探頭僅 ≤27℃)1X 模式
1.5 GHz 帶寬(保證)
1.85 GHz(典型探頭僅 ≤27℃)10X 模式
P6247
>1.0 GHz 帶寬(保證)
P6246
400 MHz 帶寬(保證)
常規(guī)
低輸入電容:
探頭輸入連接器:兩個標(biāo)準(zhǔn) 0.025 英寸/0.63 毫米(中心 0.1 英寸)方針插座(孔型)
靜電放電容限 (IEC 801-2)
使用 1103 TekProbe® 電源連接至 TDS 系列示波器或其他儀器的 TekProbe® BNC 接口
適用于示波器、頻譜分析儀或網(wǎng)絡(luò)分析器
>60 dB (1000:1) 共模抑制比 (CMRR)
探頭頂部較小,易于探測 SMD
應(yīng)用
通信(千兆以太網(wǎng)、IEEE-1394、光纖通道)
半導(dǎo)體特點描述 (RAMBUS)
磁盤驅(qū)動器讀取通道設(shè)計
通信脈沖形狀一致性
抖動、串?dāng)_和 BERT 測量
跳地效應(yīng)定位
P6246、P6247 和 P6248 差分探頭
P6248、P6247 和 P6246 使用戶可以在磁盤驅(qū)動器、數(shù)字 IC 設(shè)計 (RAMBUS) 和通信應(yīng)用(千兆以太網(wǎng)、IEEE-1394 Firewire 和光纖通道)通常涉及的高帶寬信號上進(jìn)行時域或頻域測量。P6248 擁有允許 RAMBUS 進(jìn)行探測和 IEEE-1394 互聯(lián)訪問的附件。較小的幾何形探頭頭部和各式各樣的探頭端部附件使這些探頭在維持高共模抑制比的情況下,輕松實現(xiàn)表面組裝器件的手動探測。
P6246、P6247 和 P6248 非常適用于磁盤驅(qū)動器讀取、通道電子裝置的設(shè)計驗證以及解決與高速邏輯相關(guān)的跳地效應(yīng)問題時的定時分析。它們還可用于高速通信信號的脈沖形狀或串?dāng)_的一致性測試。
Features and benefits
P6248
1.7 GHz (typical probe only 27 ℃ or less) 1 x model
1.5ghz bandwidth (guaranteed)
1.85 GHz (typical probe only 27 ℃) or less 10 x model
P6247
>1.0 GHz bandwidth (guaranteed)
P6246
400 MHz bandwidth (guaranteed)
conventional
Low input capacitance:
Probe input connector: two standard 0.025in / 0.63mm (center 0.1in) policy sockets (hole)
Electrostatic discharge capacitance limit (IEC 801-2)
Use 1103 TekProbe ® power connections to the TDS series oscilloscope or other instruments TekProbe ® BNC interface
Suitable for oscilloscope, spectrum analyzer or network analyzer
>60 dB (1000:1) common mode rejection ratio (CMRR)
The probe has a small top and is easy to detect SMD
application
Communication (gigabit Ethernet, ieee-1394, fiber channel)
Description of semiconductor characteristics (RAMBUS)
Disk drive read channel design
Communication pulse shape consistency
Jitter, crosstalk, and BERT measurements
Jumping effect location
P6246, P6247 and P6248 difference probes
P6248, P6247, and P6246 enable users to make time-domain or frequency-domain measurements on high-bandwidth signals typically involved in disk drives, digital IC design (RAMBUS), and communications applications (gigabit Ethernet, ieee-1394 Firewire, and fiber channel). P6248 has attachments that allow RAMBUS to probe and ieee-1394 interconnect. Small geometry probe heads and a variety of probe end attachments enable these probes to easily perform manual detection of surface assembly devices while maintaining a high CMRR.
P6246, P6247 and P6248 are very suitable for disk drive reading, design verification of channel electronic devices and timing analysis when solving the jumping effect problems related to high-speed logic. They can also be used for conformance testing of pulse shape or crosstalk of high-speed communication signals.