TDP4000低壓差分探頭

特性和優(yōu)點

• 出色的電子性能

• 3.5 GHz 和 1.5 GHz 帶寬型號 – 準(zhǔn)確測量串行和數(shù)字應(yīng)用

• 出色的共模抑制 – 減少更高共用環(huán)境中的錯誤

• 低電容和電阻負(fù)載 – 保持信號保真度并降低直流偏壓相互影響

• 全面的機(jī)械性能

• 用于探測小型幾何電路元件的緊湊型探頭頭部尺寸

• 利用 DUT 連接附件能夠連接適當(dāng)間隔的 SMD

• 強(qiáng)大的可靠性設(shè)計

• 易用性

• 直接連接到具有 TekVPI™ 探頭接口的示波器

• 在示波器畫面上實現(xiàn)自動單位縮放和讀數(shù)

• 輕松訪問探頭補(bǔ)償盒控制或示波器探頭菜單顯示，了解狀態(tài)、設(shè)置控制和診斷信息

• 集成示波器/探頭系統(tǒng)

• 直接連接 TekVPI™ 示波器接口并從中供電（直接連接至 TekVPI 示波器，無需像許多競爭對手要求的那樣需要外部電源）

• 單鍵訪問示波器探頭菜單

• 從探頭補(bǔ)償盒或示波器用戶界面進(jìn)行設(shè)置和控制

• 自動調(diào)零 – 輸出偏置調(diào)零

• 通過示波器實現(xiàn)遠(yuǎn)程 GPIB/USB 探頭控制

應(yīng)用

• 常見高速串行總線設(shè)計的設(shè)計、驗證、調(diào)試和檢定：

• I2C

• CAN/LIN

• SPI

• 串行 ATA

• 以太網(wǎng) (GbE)

• USB 2.0

• FireWire (1394b)

• 信號完整性、抖動和定時分析

• 制造工程和測試

差分探頭 – 更好的測量工具

差分有源探頭為高頻測量提供了更真實的信號復(fù)制和保真度。通過超低輸入電容和通用被測設(shè)備連接能力，TDP1500 和 TDP3500 差分端有源探頭提供了當(dāng)今數(shù)字系統(tǒng)設(shè)計所需要的的高速電子和機(jī)械性能。

TDP1500 和 TDP3500 差分探頭經(jīng)過專門設(shè)計，可使用和直接連接到帶有 TekVPI™ 探頭接口的示波器，通過解決以下三個傳統(tǒng)問題來實現(xiàn)高速信號采集和測量保真度：

• DUT 負(fù)載效應(yīng) – 通過降低輸入電容和高輸入電阻來減少

• DUT 連接能力 – 各種附件可用于連接小型 SMD，一些為標(biāo)配，一些為推薦使用

• 系統(tǒng)（示波器和探頭）帶寬 – 用于高達(dá) 3.5 GHz 的 TekVPI 接口示波器型號所有測量的探測解決方案

Features and benefits

Excellent electronic performance

3.5ghz and 1.5ghz bandwidth models - accurate measurement of serial and digital applications

Excellent common mode suppression - reduces errors in higher common environments

Low capacitance and resistance load - maintains signal fidelity and reduces dc bias interaction

Overall mechanical properties

Compact probe head dimensions for detection of small geometric circuit elements

Use the DUT connection attachment to be able to connect properly spaced SMDS

Strong reliability design

Ease of use

Directly connected to a TekVPI ™ oscilloscope probe interface

Realize automatic unit scaling and reading on oscilloscope screen

Easily access the probe compensation box control or oscilloscope probe menu display to understａnd the status, setting control and diagnostic information

Integrated oscilloscope/probe system

Direct connection TekVPI ™ oscilloscope interface and power supply (direct connection to TekVPI oscilloscope, need not need as many competitors require external power supply)

Single key access oscilloscope probe menu

Setup and control from the probe compensation box or oscilloscope user interface

Auto zero - output offset zero

Remote GPIB/USB probe control is realized through oscilloscope

application

Design, verification, debugging and verification of common high-speed serial bus design:

I2C

CAN/LIN

SPI

Serial ATA

Ethernet (GbE)

USB 2.0

FireWire (1394 b)

Signal integrity, jitter, and timing analysis

Manufacturing engineering and testing

Differential probe - a better measuring tool

Differential active probe provides more real signal replication and fidelity for high frequency measurement. The TDP1500 and TDP3500 differential end active probes provide the superior high-speed electronic and mechanical performance required for today's digital system design through ultra-low input capacitance and universal device connectivity.

TDP1500 and TDP3500 difference probe specially designed, it can be used and connected directly to the with TekVPI ™ oscilloscope probe interface, by solving the problem of the following three traditional fidelity of high-speed signal acquisition and measurement:

DUT load effect - reduced by reducing input capacitance and high input resistance

DUT connectivity - a variety of accessories can be used to connect small SMDS, some standard, some recommended

System (oscilloscope and probe) bandwidth maximization - detection solution for all measurements up to 3.5 GHz TekVPI interface oscilloscope models