Multi-Contact Wedge

The GGB Industries MULTI-CONTACT WEDGE allows for more chip design flexibility because it is custom configured to your circuit. Four Wedges can be used at the same time to probe a complete chip.

With its individually spring loaded, Beryllium-Copper tips, the Multi-Contact Wedge provides reliable contacts, even when probing non-planar structures. This reliable low resistance contact is one of the keys to providing highly repeatable measurements. The Multi-Contact Wedge also provides direct viewing of the probe tips for accurate positioning.

When used with standard microwave probe stations the Wedges can first be positioned to any microwave calibration standard and then moved into position on the MMIC or Module to be tested.

The probe points on a Wedge can even be set to different depths so that multi-level modules can be successfully probed. Any pitch (tip spacing) from 50 to 1250 microns may be specified. Larger pitch probes are available by special order. The probes can be configured with Ground-Signal-Ground (G,S,G), Ground-Signal (G,S), or Signal-Ground (S,G) tip footprints.

Connection to the Model 40A is through a female K connector and is compatible with SMA and 3.5mm connectors. Connection to the Model 50A is through a female 2.4mm connector. Connection to the Model 67A is through a female V connector and is compatible with the 2.4mm connector. Connection to the Model 110A is through a W (1.1mm) or a 1.0 mm connector.

FIGURE 3

Many different wiring configurations are available for the dc, power supply, or medium frequency needles. Ribbon cable, coaxial cable, and hook up wire are some of the types available. Our standard connectors include banana plugs, BNC connectors, SMA connectors, (9, 15, 25, or 37) pin D-Subminiature connectors, (20 or 26) pin AMP-LATCH receptacles, which are center and military polarized. The AMP-LATCH receptacles have a double row of ntacts on 0.1 inch centers and will receive .025 inch square or round pins. Other connectors can be specified.

FIGURE 4

Bypass capacitors for the power supply pins are available in three different locations ("A", "B", and "D") using a process patented by GGB Industries, Inc.

FIGURE 5

MCW-14 MCW-26 DC Multi-Contact Wedge

Features Durable Up to 26 DC probe needles Contacts are a dual row of 0.025 inch square pins on 0.1 inch centers Direct viewing of probe needles 3 capacitor bypass locations available Inexpensive, fast, custom fabrication Each wedge custom made to your layout Patented coaxial design

FIGURE 6

Probe needles can be set to different depths so that multi-level modules can be probed successfully. The unique design of the MCW-14 and MCW-26 Multi-Contact Wedges ensures reliable contacts, even when probing non-planar structures and allows for easy positioning when used with any standard microwave probe station.

FIGURE 7

MCW-14 & MCW-26 Multi-Contact Wedge Dimensions

FIGURE 8

Contacts are a dual row of 0.025 inch square pins on 0.1 inch centers.