Differential Calibration Substrates

The GGB Industries, Inc., line of DIFFERENTIAL CALIBRATION SUBSTRATES allows the user to calibrate any GGB Industries, Inc., microwave Picoprobe® at the probe tip.

The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected. The GGB Industries, Inc., line of calibration substrates is such a standard.

Each calibration substrate contains highly precise elements for calibrating out the unavoidable errors and losses in a microwave network analyzer, its associated cabling, and the microwave probe to ensure accurate on-wafer testing.

• Supports Precise SOLT, LRL and LRM calibrations
• Includes CalKit software for easy loading to Network Analyzer
• Pitch range from 45 to 1325 microns
• Suitable for all Picoprobes® from DC to 110 GHz
• Available for GSGSG , GSSG, and SGS Footprints
• Load standards individually trimmed to 0.25% accuracy
• 25 mil (635 micron) thick alumina substrate

Our accurate, easy to use calibration substrates, calibration coefficients, and detailed instructions allow you to precisely calibrate the measurement system to the probe tips.

The typical elements for calibrating a microwave measurement system consists of opens, shorts, 50 ohm loads, and throughs.  Our precision crafted calibration substrates, when properly used, assure you of accurate on-wafer test results.

All load standards are individually inspected and trimmed to within 0.25% accuracy using NIST traceable equipment.

Easy to use step by step instructions are provided for use with Agilent ENA four port network analyzers and Agilent PNA network analyzers with PLTS software.

SOLT = Short-Open-Load-Through
LRL = Line-Reflect-Line
LRM = Line-Reflect-Match